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Material Detail

Introduction to Scanning Probe Microscopy

Introduction to Scanning Probe Microscopy

This learning module teaches the principles behind scanning tunneling microscopy and atomic force microscopy. The module includes example applications and ample literature citations. Scanning tunneling (STM), atomic force (AFM), lateral (friction) force, magnetic force, chemical force and phase imaging are discussed.
Keywords:
stem education, workforce development, technician training, advanced technological education
Disciplines:
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More about this material

Material Type:
Reference Material
Date Added to MERLOT:
August 3, 2016
Date Modified in MERLOT:
August 3, 2016
Author:
Submitter:
Barbra Bied Sperling
Hispanic Serving Institution
Primary Audience:
College General Ed, College Lower Division, College Upper Division, Graduate School, Professional
Technical Format:
Website
Mobile Compatibility:
Not specified at this time
Language:
English
Cost Involved:
No
Source Code Available:
No
Accessibility Information Available:
Unknown
Creative Commons:
No

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