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MERLOT II




        

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Atomic Force Microscopy

        

Atomic Force Microscopy

Logo for Atomic Force Microscopy
Atomic Force Microscopy is has become an indispensible tool in nanoscience for the fabrication, metrology, manipulation and property characterization of nanostructures. In this tutorial, we will review the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the oscillating tip, and the basic theory of some of the common modes of AFM operation. We will end with a summary of the some of the exciting new applications of Atomic Force Microscopy.
Material Type: Presentation
Technical Format: Flash
Date Added to MERLOT: January 05, 2006
Date Modified in MERLOT: July 14, 2012
Author:
Submitter: nanoHUB

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Primary Audience: College General Ed
Mobile Compatibility: Not specified at this time
Language: English
Cost Involved: no
Source Code Available: no
Accessiblity Information Available: no
Creative Commons: unsure

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