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On the Reliability of Micro-electronic Devices: An Introductory Lecture on Negative Bias Temperature Instability

        

On the Reliability of Micro-electronic Devices: An Introductory Lecture on Negative Bias Temperature Instability

Logo for On the Reliability of Micro-electronic Devices:  An Introductory Lecture on Negative Bias Temperature Instability
For many of us, analyzing a semiconductor device means computing its I-V characteristics, determine its circuit speed, etc. Of course, without such understanding, a VLSI circuit can not be made. However, once made, the transistors will now have to survive trillions of switching cycles over several years of operation. How do you know that if you make a transistor with a certain specifications, that it will be able to operate reliability over a specified period of time? The people who work on the... More
Material Type: Presentation
Technical Format: Flash
Date Added to MERLOT: January 05, 2006
Date Modified in MERLOT: January 05, 2006
Author:
Submitter: nanoHUB

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Primary Audience: College General Ed
Mobile Compatibility: Not specified at this time
Language: English
Cost Involved: no
Source Code Available: no
Accessiblity Information Available: no
Creative Commons: unsure

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