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Characterization & Testing of Nanotechnology Structures and Materials

Characterization & Testing of Nanotechnology Structures and Materials

This page from the Nanotechnology Applications and Career Knowledge (NACK) Center presents a course on characterization and testing of nanotechnology structures and materials. Electrical, optical, physical and chemical characterization approaches are covered. The course will allow students hands-on experience with the Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), flourescence microscopes and fourier transform infared spectroscopy. Materials include an overview of topics and course outline and a PowerPoint presentation on characterization. This and all other valuable resources from the NACK Center require a fast, easy, free log-in.

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