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"On the Reliability of Micro-electronic Devices:  An Introductory Lecture on Negative Bias Temperature Instability" icon

On the Reliability of Micro-electronic Devices: An Introductory Lecture on Negative Bias Temperature Instability

For many of us, analyzing a semiconductor device means computing its I-V characteristics, determine its circuit speed, etc. Of course, without such understanding, a VLSI circuit can not be made. However, once made, the transistors will now have to survive trillions of switching cycles over several years of operation. How do you know that if you make a transistor with a certain specifications, that it will be able to operate reliability over a specified period of time? The people who work on the physics of reliability try to answer this question with a combination of accelerated tests and fundamental studies of “How things break?â€? I will demonstrate how this done by using examples based on our recent research, hoping that you will catch a glimpse of the complexity of the reliability... Show More
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