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"Electronic Transport Through Self-Assembled Monolayers" icon

Electronic Transport Through Self-Assembled Monolayers

Characterization of charge transport in molecular scale electronic devices has to date shown exquisite sensitivity to specifics of device fabrication and preparation. Thus, intrinsic molecular band structure has been problematic to extract from published results. Here we demonstrate cross-platform device characterization for the metal-insulator-metal (M-I-M) tunneling through a large bandgap alkanethiol self-assembled monolayers (SAMs). Electronic charge transport is investigated for various-length alkanethiol SAMs using three different characterization methods, in which lateral areas span the nanometer to the micrometer scale. In each method, the measured current-voltage characteristics are analyzed with metal-insulator-metal tunneling models. Transport parameters are determined where... Show More
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