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Novel scanning microscope for visualization of individual emission sites on flat field emission cathodes

Novel scanning microscope for visualization of individual emission sites on flat field emission cathodes

This video was recorded at SLONANO conference, Ljubljana 2007. We present first results obtained by a novel scanning projection field emission microscope (SPFEM) designed to study flat broad-area field emission cathodes. The instrument merges capabilities of measuring the electron field emission current from an individual emitting site and genuine projection of electrons onto a luminescent screen. This is achieved by an optimized shape of the anode probe having a 0.04 mm aperture which generates an uniform macroscopic electric field across the investigated area of the cathode. This fact also enables presentation of the relation between the current density and the applied electric field. The magnification of the electron-optical system alone was calculated by computational modeling for some... Show More
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